A study of the first electrical forming stage of thin-film metal-insulator-metal systems

Khaskelberg M. B., Kramor S. S.

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In the paper the results of study of the first stage electrical forming in thin-film MIM - systems are presented. It was found, that there was a threshold voltage ~ 1,5 V below which the process of forming was strongly decelerated or absolutely stopped. The presence of a latent stage of forming was also detected. When investigating the conductance of MIM-system after the first stage of forming, two characteristic regions were chosen. In the first region (U

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Issue: 9, 2000

Series of issue: Science

Rubric: Academic Papers

Pages: 13 — 18

Downloads: 949